The modern vector network analyzers before the measurement of radio frequencies and microwaves.
david ballo
The need to accurately characterize the linear and non-linear performance of high-frequency components, coupled with the trend toward greater subsystem integration, is changing the way RF and microwave devices are tested. This article addresses these issues further and discusses the adaptation that vector network analyzers (VNAs) are undergoing by adding a second internal signal generator and expanding test system ports. It also describes the progress made in VNA calibration that allows the accuracy associated with two-port S-parameter measurements to be maintained.
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