Defining a new generation of network analyzers
By Dave Ballo, Agilent Technologies
Today, R&D and manufacturing managers and engineers must face significant challenges. Each group has specific needs. In manufacturing processes, for example, engineers must reduce test times while increasing productivity and throughput. In this context, speed takes on extreme importance. In R&D, on the other hand, solving design challenges faster and with fewer iterations is essential. Therefore it is important to maintain ease of use in this segment of the product development life cycle. The problem, of course, is that these “needs” are somewhat at odds with the current state of test and measurement solutions, especially considering that multiple test sets are often needed to correctly characterize a device. Characterization is even more complex when the device is on a wafer. In this case, making the correct measurements is more complex than connecting a cable.
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